Title :
Increasing test accuracy by varying driver slew rate
Author_Institution :
Hilevel Technol., Irvine, CA, USA
Abstract :
A variable slew rate, together with the ability to control ascending and descending slew rates independently, significantly improves the overall accuracy of test and verification systems for application-specific ICs. Although a high slew rate is usually desirable, in some cases, such as ECL devices and devices in circuits of older vintage, a variable rate is advantageous. Essential driver characteristics are identified, and the driver model is described. For a small parts cost, and with only a negligible increase in power requirements, it is estimated that independent control of slew rates for ascending and descending edges can improve tester accuracy by several hundred picoseconds.<>
Keywords :
application specific integrated circuits; integrated circuit testing; ECL devices; application-specific ICs; ascending edges; descending edges; independent control; parts cost; power requirements; test accuracy; variable driver slew rate; verification systems; Application specific integrated circuits; Circuit testing; Cost function; Costing; Impedance; Life testing; Safety; Space vehicles; Test equipment; Throughput;
Journal_Title :
Design & Test of Computers, IEEE
