• DocumentCode
    1336462
  • Title

    In-line test of synthesised systems exploiting latency analysis

  • Author

    Williams, A.C. ; Brown, A.D. ; Zwolinski, M.

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Southampton Univ., UK
  • Volume
    147
  • Issue
    1
  • fYear
    2000
  • fDate
    1/1/2000 12:00:00 AM
  • Firstpage
    33
  • Lastpage
    41
  • Abstract
    During normal operation, there are periods of time in which units in a digital system (adders, multipliers etc.) are inactive (i.e. are not processing any useful data). These `latent periods´ may be exploited to continually perform sets of unit tests, thus providing a dynamic indication of the healthiness of the system with little or no effect on its performance. The paper details an analysis technique for identifying and quantifying these latent periods by modelling the flow of control through the system as a Markov chain, which takes into account branching and feedback in the controller. The resulting data describes the distribution of latent periods in an entire design, and given a testing requirement in the form of a minimum number of (latent) cycles required to perform a test, provides a figure for how often and to what extent a particular unit may be tested during normal operation. This analysis is utilised to investigate the impact particular optimisation strategies have on the distribution of latent periods, in a number of synthesised benchmark designs. These results are further developed to demonstrate how a knowledge of the latent period distribution can be used to direct the synthesis process and lead to a substantial improvement in the distribution of latent periods, whilst not over adversely affecting other design aspects, particularly the area
  • Keywords
    Markov processes; computer testing; high level synthesis; optimisation; performance evaluation; Markov chain; branching; digital system; feedback; inactive units; latency analysis; latent period distribution; optimisation; performance; synthesised systems in-line test; testing;
  • fLanguage
    English
  • Journal_Title
    Computers and Digital Techniques, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2387
  • Type

    jour

  • DOI
    10.1049/ip-cdt:20000161
  • Filename
    842728