DocumentCode :
1336489
Title :
Discretization schemes for high-frequency semiconductor device models
Author :
Ghione, Giovanni ; Benvenuti, Augusto
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
Volume :
45
Issue :
3
fYear :
1997
fDate :
3/1/1997 12:00:00 AM
Firstpage :
443
Lastpage :
456
Abstract :
This paper provides an overview on the numerical issues involved in the spatial and time-domain discretization of the coupled transport-electromagnetic models used in the simulation of high-frequency semiconductor devices. The physical transport models derived from the Boltzmann transport equation (BTE) are reviewed in order of decreasing complexity, from the full hydrodynamic model to the drift-diffusion approach. Spatial discretization is introduced starting from ad hoc approaches developed in the field of semiconductor modeling, like the Scharfetter-Gummel (1969) scheme; a critical comparison is then provided with the upwind finite-element schemes. Finally, time-domain discretization issues are reviewed, with particular stress on innovative developments in the area of hydrodynamic and of coupled transport-full-wave EM models
Keywords :
Boltzmann equation; Schottky gate field effect transistors; finite element analysis; microwave field effect transistors; semiconductor device models; time-domain analysis; transport processes; Boltzmann transport equation; HF semiconductor device simulation; MESFET; Scharfetter-Gummel scheme; coupled transport-electromagnetic models; coupled transport-full-wave EM models; drift-diffusion approach; high-frequency semiconductor device models; hydrodynamic model; physical transport models; spatial-domain discretization; time-domain discretization; upwind finite-element schemes; Boltzmann equation; Design automation; Electromagnetic modeling; Hydrodynamics; Nonlinear equations; Semiconductor device modeling; Semiconductor devices; Solid modeling; Solid state circuits; Time domain analysis;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/8.558659
Filename :
558659
Link To Document :
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