DocumentCode :
1336500
Title :
Acceleration sensitivity of crystal resonators affected by the mass and location of electrodes
Author :
Lee, P.C.Y. ; Guo, X.
Author_Institution :
Dept. of Civil Eng. & Oper. Res., Princeton Univ., NJ, USA
Volume :
38
Issue :
4
fYear :
1991
fDate :
7/1/1991 12:00:00 AM
Firstpage :
358
Lastpage :
365
Abstract :
Predominant thickness-shear frequencies and modes of a crystal plate with electrodes of arbitrary shape and mass distribution are obtained by a finite-element method, based on Mindlin´s first-order equations with platings. These frequencies and modes are used in a perturbation method for computing the acceleration sensitivity of crystal resonators with electrodes. Computations are made for a square AT-cut quartz plate that is supported by a four-point mount and coated with identical square and uniform electrodes on the upper and lower faces of the plate. To study the effect of uneven distribution of electrode mass, acceleration sensitivities are calculated when a small mass is added at various locations near the edges of the square electrodes. It is found that the percent increase of the acceleration sensitivity of the resonator with a small added mass to that of the resonator without added mass ranges from 3.8% to 541.7%, depending on the location of the small mass placed at the edges of the electrodes.<>
Keywords :
crystal resonators; finite element analysis; frequency stability; quartz; Mindlin´s first-order equations; SiO/sub 2/; acceleration sensitivity; crystal resonators; electrode location effect; electrode mass effect; finite-element method; four-point mount; perturbation method; small added mass; square AT-cut quartz plate; thickness shear mode; uneven distribution of electrode mass; Acceleration; Contracts; Electrodes; Equations; Finite element methods; Frequency; Resonance; Shape; Stress; Two dimensional displays;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.84275
Filename :
84275
Link To Document :
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