DocumentCode :
1336836
Title :
Experimental evidence of chaotic behavior in atmospheric pressure arc discharge
Author :
Ghorui, S. ; Sahasrabudhe, S.N. ; Murthy, P.S.S. ; Das, A.K. ; Venkatramani, N.
Author_Institution :
Laser & Plasma Technol. Div., Bhabha Atomic Res. Centre, Mumbai, India
Volume :
28
Issue :
1
fYear :
2000
fDate :
2/1/2000 12:00:00 AM
Firstpage :
253
Lastpage :
260
Abstract :
In free burning as well as in stabilized arc columns, the inherent movement of arc root results in fluctuation in arc voltage. A full knowledge and control over the arc root dynamics can effectively lengthen the life time, drastically improve performance and reliability in arc plasma devices. In this paper, we experimentally investigate the fluctuating voltage signals generated from an atmospheric pressure arc discharge produced in a hollow electrode plasma torch. For the first time, analysis of these signals reveal them to exhibit chaotic behavior. The present analysis is supported with real time behavior, phase portraits, power spectra and Lyapunov exponents. Dependence of system behavior on various control parameters is also investigated. This approach is interesting in the sense that it can lead to better understanding of physics for future researches on arc plasma jets and related devices
Keywords :
arcs (electric); chaos; plasma devices; plasma fluctuations; plasma pressure; plasma torches; Lyapunov exponents; arc plasma devices; arc plasma jets; arc root dynamics; arc root lifetime; atmospheric pressure arc discharge; attractors; chaos; chaotic behavior; control parameters; fluctuating voltage signals; free burning arc columns; hollow electrode plasma torch; performance; phase portraits; power spectra; real time behavior; reliability; stabilized arc columns; thermal plasma device; Arc discharges; Atmospheric-pressure plasmas; Chaos; Control systems; Electrodes; Physics; Plasma devices; Signal analysis; Signal generators; Voltage fluctuations;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.842916
Filename :
842916
Link To Document :
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