Title :
Model law for gas isolated system
Author :
Osmokrovic, Predrag ; Kartalovic, Nenad ; Atanackov, Natasa ; Ostojic, Dragana
Author_Institution :
Fac. of Electr. Eng., Belgrade Univ., Serbia
fDate :
2/1/2000 12:00:00 AM
Abstract :
This paper considers a change of probability of the electrical breakdown of gases as a function of the examination model dimensions. Since investigation of the breakdown voltage of gases on a real-scale apparatus is not economical because of the time and money required, investigations are usually conducted on the small laboratory model. During the model law derivation, real-scale apparatus is represented by a planar capacitor while the model is represented also by a planar capacitor but with smaller dimensions. Decreasing of dimensions of the real capacitor was performed in two successive steps: the first, by decreasing the surface area S of the plates and the second, by decreasing the interelectrode gap value d. Analytical expressions for the model law of a gas insulation have been obtained by treating the electrical discharge of gases like avalanche processes in real space and in the sense of Markov processes in the probability space. Theoretically obtained results were confirmed experimentally. Also, expressions for model law of the gas isolation derived in this paper make application possible of obtained results for designing gas isolated systems with real dimensions
Keywords :
Markov processes; capacitors; discharges (electric); electric breakdown; Markov chains; Markov processes; avalanche processes; breakdown voltage; dynamic breakdown; electrical breakdown probability; electrical discharge; examination model dimensions; gas electric breakdown; gas isolated system; gas isolation; interelectrode gap; model law; planar capacitor; probability space; real dimensions; real space; real-scale apparatus; surface area; Avalanche breakdown; Capacitors; Electric breakdown; Electrodes; Gases; Ionization; Laboratories; Surface discharges; Testing; Voltage;
Journal_Title :
Plasma Science, IEEE Transactions on