• DocumentCode
    1336947
  • Title

    Spurious surface finish improvement of the infrared extinction coefficient of alpha quartz

  • Author

    Gualtieri, J.G. ; Blisnuk, K.L.

  • Author_Institution
    USA ETDL, Fort Monmouth, NJ, USA
  • Volume
    38
  • Issue
    5
  • fYear
    1991
  • Firstpage
    494
  • Lastpage
    497
  • Abstract
    Infrared extinction coefficients obtained using quartz samples lapped with a 3 mu m abrasive compound were found to be much smaller than anticipated. The improvement in extinction coefficient is traceable to the irregular surface finish. To demonstrate this improvement, polished quartz samples were evaluated and compared to evaluations after lapping the same sample with 3 mu m and 12 mu m abrasives. In one sample, a 3 mu m finish resulted in an almost 30% improvement in the extinction coefficient evaluated at 3500 cm/sup -1/. Lapping of the sample to a 12 mu m finish resulted in an almost 90% improvement. These improvements in alpha correspond to improvements in Q/sub IR/ (3500) from 2.58 million (polished) to 3.03 million (3 mu ) to 4.71 million (12 mu m). The improvement is caused by wavelength dependent transmission losses due to surface irregularities. The surface transmission losses can be reduced by polishing the optical surfaces or by applying index matching fluids to 3 mu m lapped surfaces.<>
  • Keywords
    infrared spectra of inorganic solids; optical constants; polishing; quartz; surface topography; surface treatment; 3500 cm/sup -1/; SiO/sub 2/; abrasive compound; alpha quartz; index matching fluids; infrared extinction coefficient; lapped surfaces; optical surfaces; polished quartz samples; spurious surface finish; surface irregularities; wavelength dependent transmission losses; Abrasives; Extinction coefficients; IEC standards; Lapping; Optical resonators; Optical surface waves; Propagation losses; Surface finishing; Surface waves; Testing;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.84295
  • Filename
    84295