DocumentCode
1337001
Title
Integrated GaAs Schottky mixers by spin-on-dielectric wafer bonding
Author
Marazita, Steven M. ; Bishop, William L. ; Hesler, Jeffrey L. ; Hui, Kai ; Bowen, Willie E. ; Crowe, Thomas W.
Author_Institution
Virginia Millimeter Wave Inc., Charlottesville, VA, USA
Volume
47
Issue
6
fYear
2000
fDate
6/1/2000 12:00:00 AM
Firstpage
1152
Lastpage
1157
Abstract
A novel wafer bonding process has been used to integrate high quality GaAs devices on quartz substrates. The method of adhesion by spin-on-dielectric temperature enhanced reflow (MASTER) uses a spin-on-dielectric as a bonding agent to achieve a robust bond that in no way degrades either high frequency performance or reliability. A 585 GHz integrated mixer fabricated using this process has achieved record double-sideband mixer noise temperatures of 1,150 K at room temperature and 880 K at 77 K. Furthermore, the integrated mixers require no mechanical tuning, are easy to assemble, and repeatable. Precise control of the circuit geometry, coupled with the reduction of parasitic elements, allows greater accuracy of computer simulations and will therefore lead to better high frequency performance and bandwidth. This new technology is easily extended to other circuit designs and will allow the development of a new generation of submillimeter-wave integrated circuits
Keywords
III-V semiconductors; Schottky diode mixers; gallium arsenide; monolithic integrated circuits; submillimetre wave diodes; submillimetre wave integrated circuits; submillimetre wave mixers; wafer bonding; 585 GHz; 77 K; GaAs Schottky mixers; GaAs-SiO2; MASTER method; SiO2; double-sideband mixer noise temperatures; high frequency performance; high quality GaAs devices; integrated mixers; quartz substrates; reliability; spin-on-dielectric wafer bonding; submillimeter-wave ICs; temperature enhanced reflow; Adhesives; Circuit optimization; Degradation; Frequency; Gallium arsenide; Integrated circuit reliability; Noise robustness; Submillimeter wave technology; Temperature; Wafer bonding;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.842956
Filename
842956
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