DocumentCode :
1337008
Title :
Optimization procedure for the design of ultrafast, highly efficient and selective resonant cavity enhanced Schottky photodiodes
Author :
Jervase, Joseph A. ; Bourdoucen, Hadj
Author_Institution :
Coll. of Eng., Sultan Qaboos Univ., Muscat, Oman
Volume :
47
Issue :
6
fYear :
2000
fDate :
6/1/2000 12:00:00 AM
Firstpage :
1158
Lastpage :
1165
Abstract :
An expression of quantum efficiency for high-speed resonant-cavity-enhanced (RCE) Schottky photodiodes is derived. This expression includes the structural and the physical parameters of the photodetector and takes into account the parameters of the metallic Schottky mirror and the wavelength dependence of the reflectivities. The metal layer thickness sets the maximum achievable quantum efficiency as it decays exponentially with it. The antireflection coating layer, on the other hand, determines the photodetector selectivity and the optimum absorption layer thickness that maximizes its quantum efficiency. An algorithm for the design and optimization of RCE Schottky photodetectors has been developed. Theoretical values of 647 GHz and 129 GHz were obtained, respectively, for the carrier-transit time limited 3-dB bandwidth and bandwidth-efficiency product for an RCE Schottky photodetector with a 0.02 μm gold layer
Keywords :
Schottky diodes; antireflection coatings; cavity resonators; photodiodes; semiconductor device models; 0.02 micron; 647 GHz; Schottky photodiodes; achievable quantum efficiency; antireflection coating layer; bandwidth-efficiency product; carrier-transit time limited 3-dB bandwidth; metallic Schottky mirror; optimum absorption layer thickness; photodetector selectivity; physical parameters; quantum efficiency; selective resonant cavity enhanced devices; structural parameters; wavelength dependence; Absorption; Algorithm design and analysis; Bandwidth; Coatings; Design optimization; Mirrors; Photodetectors; Photodiodes; Reflectivity; Resonance;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.842957
Filename :
842957
Link To Document :
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