Title :
Majority Gates Applied to Simultaneous Comparators
Author_Institution :
RCA Laboratories, Princeton, N. J
fDate :
3/1/1961 12:00:00 AM
Keywords :
Circuit faults; Computer networks; Crystallization; Equations; Flip-flops; History; Organisms; Oscillators; Pulse circuits; Radio frequency;
Journal_Title :
Electronic Computers, IRE Transactions on
DOI :
10.1109/TEC.1961.5219160
