Title :
Further Results on the N-tuple Pattern Recognition Method
Author_Institution :
Advanced Research, Palo Alto, Calif.
fDate :
3/1/1961 12:00:00 AM
Keywords :
Character recognition; Correlation; Handwriting recognition; Inspection; Instruments; Lead; Logic; Pattern recognition; Telephony; Testing;
Journal_Title :
Electronic Computers, IRE Transactions on
DOI :
10.1109/TEC.1961.5219162
