DocumentCode :
1337185
Title :
Future Device Modeling Trends
Author :
Root, David E.
Author_Institution :
Agilent Technol. Inc., Santa Rosa, CA, USA
Volume :
13
Issue :
7
fYear :
2012
Firstpage :
45
Lastpage :
59
Abstract :
Good transistor models are essential for efficient computer-aided-design (CAD) of nonlinear microwave and RF circuits, monolithic microwave integrated circuits (MMICs), power amplifiers (PAs), and nonlinear RF systems. Increasingly complicated demands of the various semiconductor technologies (e.g., GaAs pHEMTs, InP double heterojunction bipolar transistors (DHBTs), silicon on insulator (SOI), LDMOS, GaN HFETs, etc.), and their applications in terms of power and frequency of operation and complexity of applied signals (e.g., modern communication signals with high peak-toaverage ratios) have placed commensurate requirements on the accuracy and generality of the device models used for design. New semiconductor material systems (e.g., GaN) have been developing at such a fast rate that conventional compact modeling approaches may not be able to keep up. These and other challenges have spawned much research into the advanced nonlinear device modeling techniques that are the focus of this article.
Keywords :
MMIC; circuit CAD; integrated circuit modelling; microwave circuits; power amplifiers; semiconductor device models; CAD; MMIC; RF circuits; advanced nonlinear device modeling; applied signals; compact modeling; computer-aided-design; device modeling trends; device models; high peak-to-average ratios; modern communication signals; monolithic microwave integrated circuits; nonlinear RF systems; nonlinear microwave circuits; power amplifiers; semiconductor material systems; semiconductor technologies; transistor models; Design automation; Microwave amplifiers; Microwave circuits; Microwave communication; Microwave integrated circuits; Modeling; Nonlinear circuits; Solid modeling; Transistors;
fLanguage :
English
Journal_Title :
Microwave Magazine, IEEE
Publisher :
ieee
ISSN :
1527-3342
Type :
jour
DOI :
10.1109/MMM.2012.2216095
Filename :
6355793
Link To Document :
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