Title :
Analysis of photometric properties of occluding edges by the reversed projection blurring model
Author :
Asada, Naoki ; Fujiwara, Hisanaga ; Matsuyama, Takashi
Author_Institution :
Dept. of Intelligent Syst., Hiroshima City Univ., Japan
fDate :
2/1/1998 12:00:00 AM
Abstract :
This paper analyzes photometric properties of occluding edges and proves that an object surface behind a nearer object is partially observable beyond the occluding edges. We first discuss a limitation of the image blurring model using the convolution, and then present an optical flux based blurring model named the reversed projection blurring (RPB) model. Unlike the multicomponent blurring model proposed by Nguyen et al., the RPB model enables us to explore the optical phenomena caused by a shift-variant point spread function that appears at a depth discontinuity. Using the RPB model, theoretical analysis of occluding edge properties are given and two characteristic phenomena are shown: (1) a blurred occluding edge produces the same brightness profiles as would be predicted for a surface edge on the occluding object when the occluded surface radiance is uniform and (2) a nonmonotonic brightness transition would be observed in blurred occluding edge profiles when the occluded object has a surface edge. Experimental results using real images have demonstrated the validity of the RPB model as well as the observability of the characteristic phenomena of blurred occluding edges
Keywords :
convolution; edge detection; image segmentation; optical transfer function; photometry; RPB model; blurred occluding edge; brightness profiles; convolution; depth discontinuity; image blurring model; multicomponent blurring model; nonmonotonic brightness transition; occluding edge properties; occluding edges; optical flux based blurring model; optical phenomena; photometric properties; reversed projection blurring model; shift-variant point spread function; uniform occluded surface radiance; Brightness; Computer Society; Convolution; Focusing; Image analysis; Image edge detection; Layout; Optical variables control; Photometry; Predictive models;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on