DocumentCode :
1337402
Title :
Structural analysis of DEM´s by intersection of surface normals in a three-dimensional accumulator space
Author :
Baudemont, Frédéric ; Parrot, Jean-François
Author_Institution :
LGGST, UPMC, Paris, France
Volume :
38
Issue :
3
fYear :
2000
fDate :
5/1/2000 12:00:00 AM
Firstpage :
1191
Lastpage :
1198
Abstract :
This paper proposes a new methodology in DEM analysis in order to extract relevant information. The method proposed generates a set of 3D accumulators by using the DEM data. Each accumulator contains the number of intersections of the normals derived from the DEM surface. An alternative procedure has been developed in order to minimize the huge memory space required by a complete set of voxels. The principle consists of scanning the discrete space by a vertical plane. This plane, called a Voxel Wall, is composed of all the local accumulators. Two matrices are generated. In the first, named Values of the Accumulator Matrix (VAM), the positions x,y and the corresponding maximum value μ of intersections encountered in each column of the Voxel Wall are registered. The depth ζ of each μ is coded on the second matrix, called Depth of the Accumulator Maxima (DAM). The results provided by regular shapes such as hemispheres, cones, and pyramids, as well as those produced by deformations and/or linear translations, are analyzed. An exhaustive interpretation of these results requires the creation of a catalogue of all the criteria for describing a given shape, whether it be isolated or not. The procedure has been applied to some “real” DEM containing volcanic edifices, crest lines, and bulging shapes
Keywords :
geodesy; topography (Earth); 3D accumulator; DAM; DEM; DEM analysis; Depth of the Accumulator Maxima; VAM; Values of the Accumulator Matrix; Voxel Wall; digital elevation model; geodesy; geodetic network; intersection; land surface topography; local accumulators; matrices; matrix; methodology; structural analysis; surface normal; three-dimensional accumulator space; Data mining; Image sampling; Information analysis; Interpolation; Morphology; Pattern recognition; Pixel; Polynomials; Shape; Statistics;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
Publisher :
ieee
ISSN :
0196-2892
Type :
jour
DOI :
10.1109/36.843011
Filename :
843011
Link To Document :
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