Title :
Reliability of modified designs: a Bayes analysis of an accelerated test of electronic assemblies
Author_Institution :
IBM, Research Triangle Park, NC, USA
fDate :
6/1/1990 12:00:00 AM
Abstract :
Accelerated tests on two similar assemblies suggest that their lifetimes are in excess of 30000 h. A Bayes approach to reliability estimation using life test data from the two assemblies and those from an earlier evaluation of a third assembly, similar to the two under study, is described. The Bayes approach permitted a reduction in the number of test samples, compared to the earlier evaluation. The reliability of the two new assemblies was comparable to or better than that of the older one
Keywords :
Bayes methods; electronic equipment testing; life testing; reliability; Bayes analysis; accelerated test; electronic assemblies; life test data; modified designs; reliability estimation; Assembly; Electronic equipment testing; History; Humidity; Life estimation; Life testing; Modems; Out of order; Qualifications; Reliability engineering;
Journal_Title :
Reliability, IEEE Transactions on
