• DocumentCode
    1337553
  • Title

    Measuring aerosol optical thickness with a helicopter-based sunphotometer

  • Author

    Walthall, Charles L. ; Halthore, Rangasayi N. ; Loechel, Sara E. ; Elman, Greg C. ; Markham, Brian L.

  • Author_Institution
    ARS Remote Sensing & Modeling Lab., US Dept. of Agric., Beltville, MD, USA
  • Volume
    38
  • Issue
    3
  • fYear
    2000
  • fDate
    5/1/2000 12:00:00 AM
  • Firstpage
    1410
  • Lastpage
    1416
  • Abstract
    The use of airborne sunphotometers and radiometrically calibrated sensors with fixed wing remote sensing platforms is a reliable method for obtaining atmospherically corrected surface reflectance. The authors describe a variation of such an instrument for use with helicopters. This system tracks the Sun once positioned within 30° of the solar disk. The electronics sample fast enough to collect data between passes of the rotor blades. Calibration for converting voltages to atmospheric transmittance was via the Langley plot method and by intercomparison with calibrated surface sunphotometers. Aerosol optical thickness can be inferred at discrete wavelengths in the visible and near-infrared portions of the spectrum. Aerosol optical thickness data collected with the system agrees reasonably well with data collected using other surface-based sunphotometers
  • Keywords
    aerosols; atmospheric composition; atmospheric measuring apparatus; atmospheric optics; atmospheric techniques; photometers; remote sensing; Langley plot method; aerosol; airborne sunphotometer; atmosphere; atmospheric transmittance; helicopter-based sunphotometer; instrument; measurement technique; meteorology; optical thickness; optics; radiometrically calibrated sensor; remote sensing; Aerosols; Atmospheric measurements; Helicopters; Instruments; Optical sensors; Optical surface waves; Radiometry; Reflectivity; Remote sensing; Thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/36.843035
  • Filename
    843035