DocumentCode
1337584
Title
RMS slope of exponentially correlated surface roughness for radar applications
Author
Dierking, Wolfgang
Author_Institution
Danish Center for Remote Sensing, Tech. Univ., Lyngby, Denmark
Volume
38
Issue
3
fYear
2000
fDate
5/1/2000 12:00:00 AM
Firstpage
1451
Lastpage
1454
Abstract
In radar signature analysis, the root mean square (RMS) surface slope is utilized to assess the relative contribution of multiple scattering effects. For an exponentially correlated surface, an effective RMS slope can be determined by truncating the high frequency tail of the roughness spectrum. The choice of the cutoff frequency and the effect on surface scattering simulations are discussed
Keywords
backscatter; geophysical techniques; radar cross-sections; radar theory; remote sensing by radar; rough surfaces; terrain mapping; RMS slope; backscatter; cutoff frequency; exponentially correlated surface roughness; geophysical measurement technique; high frequency tail; land surface; microwave scattering; multiple scattering; radar remote sensing; radar scattering; radar signature analysis; root mean square; rough surface; roughness spectrum; simulation; surface scattering; surface slope; terrain mapping; Clustering algorithms; Dielectrics; Ground penetrating radar; Pattern recognition; Radar applications; Radar imaging; Radar remote sensing; Remote sensing; Rough surfaces; Surface roughness;
fLanguage
English
Journal_Title
Geoscience and Remote Sensing, IEEE Transactions on
Publisher
ieee
ISSN
0196-2892
Type
jour
DOI
10.1109/36.843040
Filename
843040
Link To Document