DocumentCode :
1337584
Title :
RMS slope of exponentially correlated surface roughness for radar applications
Author :
Dierking, Wolfgang
Author_Institution :
Danish Center for Remote Sensing, Tech. Univ., Lyngby, Denmark
Volume :
38
Issue :
3
fYear :
2000
fDate :
5/1/2000 12:00:00 AM
Firstpage :
1451
Lastpage :
1454
Abstract :
In radar signature analysis, the root mean square (RMS) surface slope is utilized to assess the relative contribution of multiple scattering effects. For an exponentially correlated surface, an effective RMS slope can be determined by truncating the high frequency tail of the roughness spectrum. The choice of the cutoff frequency and the effect on surface scattering simulations are discussed
Keywords :
backscatter; geophysical techniques; radar cross-sections; radar theory; remote sensing by radar; rough surfaces; terrain mapping; RMS slope; backscatter; cutoff frequency; exponentially correlated surface roughness; geophysical measurement technique; high frequency tail; land surface; microwave scattering; multiple scattering; radar remote sensing; radar scattering; radar signature analysis; root mean square; rough surface; roughness spectrum; simulation; surface scattering; surface slope; terrain mapping; Clustering algorithms; Dielectrics; Ground penetrating radar; Pattern recognition; Radar applications; Radar imaging; Radar remote sensing; Remote sensing; Rough surfaces; Surface roughness;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
Publisher :
ieee
ISSN :
0196-2892
Type :
jour
DOI :
10.1109/36.843040
Filename :
843040
Link To Document :
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