DocumentCode :
1337672
Title :
Structural, dielectric, and ferroelectric properties of the (1ߝx)PbTiO3-xBiAlO3 solid solution
Author :
Yu, Huichun ; Ren, Wei ; Ye, Zuo-Guang
Author_Institution :
Dept. of Chem., Simon Fraser Univ., Burnaby, BC, Canada
Volume :
57
Issue :
10
fYear :
2010
fDate :
10/1/2010 12:00:00 AM
Firstpage :
2177
Lastpage :
2181
Abstract :
Ferroelectric ceramics derived from the solid solution of (1- x)PbTiO3-xBiAlO3 (x = 0, 0.05, 0.10, 0.15, and 0.18) have been synthesized by solid-state reactions. A pure perovskite phase is formed for 0 ≤ x ≤ 0.15. The tetragonality (c/a) of the solid solution decreases with the increasing amount of BiAlO3. Scanning electron microscopic images reveal a microstructure with a fine grain size of less than 1 μm for the solid solution ceramics (x ≥ 0.05). Compared with pure PbTiO3 ceramics whose high conductivity and poor densification were harmful to their dielectric performance, the ceramics of (1- x) PbTiO3-xBiAlO3 are well-densified (with a relative density of up to 93%) and their dielectric and ferroelectric properties are significantly improved with the addition of BiAlO3, exhibiting reduced dielectric losses, well-developed P-E hysteresis loops (for x = 0.05, 0.10, and 0.15) and a high remnant polarization (Pr) of 64 μC/cm2 (for x = 0.15).
Keywords :
bismuth compounds; densification; density; dielectric hysteresis; dielectric losses; dielectric polarisation; electrical conductivity; ferroelectric ceramics; grain size; lead compounds; scanning electron microscopy; solid solutions; P-E hysteresis loops; PbTiO3-BiAlO3; conductivity; densification; dielectric losses; dielectric property; ferroelectric ceramics; ferroelectric property; grain size; microstructure; perovskite phase; relative density; remnant polarization; scanning electron microscopic images; solid solution; solid-state reactions; structural property; tetragonality; Ceramics; Dielectrics; Grain size; Lead; Solids; Temperature;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2010.1675
Filename :
5587396
Link To Document :
بازگشت