A new adaptive analog test and diagnosis system

Author

Cota, Èrika F. ; Negreiros, Marcelo ; Carro, Luigi ; Lubaszewski, Marcelo

Author_Institution

Electr. Eng. Dept., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil

Volume

49

Issue

2

fYear

2000

fDate

4/1/2000 12:00:00 AM

Firstpage

223

Lastpage

227

Abstract

This paper presents a low-cost analog test system with diagnosis capabilities. The tester is able to detect faults in any linear circuit by learning a reference circuit behavior in a first step, and comparing this behavior against the output of the circuit under test in a second step. For a faulty circuit, a third step takes place to locate the fault. The diagnosis method consists in injecting probable faults in a mathematical model of the circuit, and later comparing its output with the output of the real faulty circuit. This system has been successfully applied to a case study, a biquad filter. Soft, large, and hard deviations on components, as well as faults in operational amplifiers, were considered. Experimental results have proven the feasibility and efficiency of the proposed test and diagnosis system

Keywords

adaptive filters; analogue circuits; automatic test equipment; circuit testing; fault diagnosis; operational amplifiers; DSP chips; adaptive analog test; adaptive filter; biquad filter; diagnosis system; efficiency; faults; feasibility; learning circuit; linear circuit; low-cost analog test; mathematical model; operational amplifiers; probable faults; reference circuit; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Filters; Linear circuits; Mathematical model; Operational amplifiers; System testing;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.843053

Filename

843053