DocumentCode :
1337742
Title :
Novel room temperature multiferroics for random access memory elements
Author :
Kumar, Ashok ; Katiyar, Ram S. ; Scott, James F.
Author_Institution :
Dept. of Phys., Univ. of Puerto Rico, San Juan, Puerto Rico
Volume :
57
Issue :
10
fYear :
2010
fDate :
10/1/2010 12:00:00 AM
Firstpage :
2237
Lastpage :
2242
Abstract :
We have fabricated a variety of PZT-PFW (PbZr0.52Ti0.48O3)1_x(PbFe2/3W1/3O3)x [PZTFWx; 0.2 <; × <; 0.4] single-phase tetragonal ferroelectrics via chemical solution deposition [polycrystalline] and pulsed laser deposition [epitaxial] onto Pt/Ti/SiO2/Si(100) and SrTiO3/Si substrates. These exhibit ferroelectricity and (weak) ferromagnetism above room temperature with strain coupling via electrostriction and magnetostriction. Application of modest magnetic field strength (μoH <; 1.0 T) destabilizes the long-range ferroelectric ordering and switches the polarization from approximately 22 μC/cm2 (0.22 C/m2) to zero (relaxor state). This offers the possibility of three-state logic (+P, 0, -P) and magnetically switched polarizations. Because the switching is of large magnitude (unlike the very small nanocoulomb per centimeter squared values in terbium manganites) and at room-temperature, commercial devices should be possible.
Keywords :
dielectric polarisation; electrostriction; ferroelectric switching; ferroelectric thin films; ferromagnetic materials; lead compounds; liquid phase deposited coatings; magnetic switching; magnetic thin films; magnetostriction; multiferroics; pulsed laser deposition; relaxor ferroelectrics; weak ferromagnetism; (PbZr0.52Ti0.48O3)1-x(PbFe0.67W0.33O3); Pt-Ti-SiO2-Si; Si; SrTiO3-Si; chemical solution deposition; electrostriction; ferroelectricity; long-range ferroelectric ordering; magnetic field strength; magnetically switched polarizations; magnetostriction; pulsed laser deposition; random access memory elements; relaxor state; room temperature multiferroics; single-phase tetragonal ferroelectrics; strain coupling; temperature 293 K to 298 K; three-state logic; weak ferromagnetism; Films; Leakage current; Logic gates; Magnetoelectric effects; Random access memory; Surface morphology; Surface topography;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2010.1684
Filename :
5587405
Link To Document :
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