Title :
Intrinsic microwave dielectric loss of lanthanum aluminate
Author :
Shimada, Takeshi ; Ichikawa, Koji ; Minemura, Tetsuro ; Yamauchi, Hiroki ; Utsumi, Wataru ; Ishii, Yoshinobu ; Breeze, Jonathan ; Alford, Neil McN
Author_Institution :
New Bus. Dev. Center, Hitachi Metals Ltd., Osaka, Japan
fDate :
10/1/2010 12:00:00 AM
Abstract :
The intrinsic dielectric properties of LaAlO3 were investigated to understand the microwave properties of several materials containing LaAlO3. In this study, LaAlO3 single crystals were prepared by the Czochralski method. The temperature dependence of the dielectric properties and neutron inelastic scattering of the single crystals were measured. From these data, the intrinsic dielectric properties were evaluated and it was found that the dielectric loss of the LaAlO3 includes two types of dielectric loss. One is a phonon absorption-related loss and the other is a component of the loss arising from Debye- type orientation polarization. The latter affects the room temperature dielectric loss in materials containing LaAlO3. The present study suggests that avoiding this polarization loss is an important goal in decreasing the total dielectric loss.
Keywords :
crystal growth from melt; dielectric losses; dielectric polarisation; lanthanum compounds; neutron diffraction; phonons; Czochralski method; Debye- type orientation polarization; LaAlO3; intrinsic dielectric properties; intrinsic microwave dielectric loss; neutron inelastic scattering; phonon absorption-related loss; room temperature; single crystals; Crystals; Dielectric losses; Dielectric measurements; Optical losses; Phonons; Temperature measurement;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2010.1685