A novel sensor for X-ray imaging applications

In this study, a novel direct X-ray conversion electronic sensor for X-ray imaging, aimed at the enhancement of the signal characteristics of a cadmium zinc telluride (CdZnTe) detector substrate, is proposed. CdZnTe substrates are promising candidates in detector technology since they have a high stopping power. The novelty of the sensor lies in the material of use as well as in the signal collector design, which exhibits “Frisch-grid” capabilities. As a result, the proposed technology provides an effective mode to shield the electron-collecting electrode from the charge induced on it from moving positive ions and trapped charge. Overall, this technology would allow for a decreased sensor thickness, accompanied with a high collector efficiency, and consequently improved signal characteristics. Therefore, the signal quality of an imaging sensor as applied to medical detector technology, radio astronomy, aviation security, surveillance and nondestructive inspection, and other industrial areas will be significantly improved