• DocumentCode
    1337851
  • Title

    Uncertainty analysis for four terminal-pair capacitance and dissipation factor characterization at 1 and 10 MHz

  • Author

    Koffman, Andrew D. ; Avramov-Zamurovic, Svetlana ; Waltrip, Bryan Cristopher ; Oldham, Nile M.

  • Author_Institution
    Electr. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    49
  • Issue
    2
  • fYear
    2000
  • fDate
    4/1/2000 12:00:00 AM
  • Firstpage
    346
  • Lastpage
    348
  • Abstract
    The Electricity Division at the NIST has developed the capability to characterize capacitance and dissipation factor for four terminal-pair (4TP) air dielectric capacitors at frequencies from 1 kHz to 10 MHz. The method involves single-port network analyzer impedance measurements at frequencies from 40 MHz to 200 MHz and capacitance measurements using a precision 1 kHz capacitance meter. A mathematical regression algorithm is used to extrapolate inductance and resistance measurements from the network analyzer down to 1 kHz in order to predict capacitance and dissipation factor from 1 kHz to 10 MHz. A comprehensive uncertainty analysis for the procedure is presented
  • Keywords
    capacitance measurement; capacitors; electric impedance measurement; measurement standards; measurement uncertainty; network analysers; statistical analysis; 1 MHz; 1 kHz to 10 MHz; 10 MHz; air dielectric capacitors; capacitance measurements; capacitor frequency characteristic prediction; dissipation factor; four terminal-pair; impedance measurements; impedance reference standards; precision capacitance meter; precision measurement; regression algorithm; single-port network analyzer; statistical variation; uncertainty analysis; Algorithm design and analysis; Capacitance measurement; Capacitors; Dielectrics; Electrical resistance measurement; Frequency conversion; Impedance measurement; Measurement standards; Measurement uncertainty; NIST;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.843076
  • Filename
    843076