DocumentCode :
1337897
Title :
Numerical stress analysis of resin cracking in LSI plastic packages under temperature cyclic loading
Author :
Saitoh, Takehiro
Author_Institution :
NEC Corp., Kanagawa, Japan
Volume :
19
Issue :
3
fYear :
1996
fDate :
8/1/1996 12:00:00 AM
Firstpage :
593
Lastpage :
600
Abstract :
Numerical stress analysis of resin cracking occurring in plastic packages during temperature cyclic loading was carried out using a thermoelastic finite-element method (FEM) for the nonlinear contact problem. Through the use of the linear fracture mechanics approach to the bimaterial problem, the analysis provides a fracture parameter and indicates the direction in which resin cracking occurs. Temperature cycling tests using actual plastic packages were also performed to verify the validity of the analysis results experimentally. It was found that the test results agreed well with the analytical results. It was also clear that the delamination occurring between dissimilar materials determines the degree to which resin cracking occurs quantitatively and the most harmful delamination occurs in the die bonding layer. The resin cracking mechanism was studied and a countermeasure against it was proposed
Keywords :
delamination; finite element analysis; fracture mechanics; integrated circuit packaging; large scale integration; plastic packaging; stress analysis; thermal stress cracking; LSI plastic packages; bimaterial problem; delamination; die bonding layer; fracture parameter; linear fracture mechanics; nonlinear contact problem; numerical stress analysis; resin cracking; temperature cyclic loading; temperature cycling tests; thermoelastic finite-element method; Delamination; Finite element methods; Large scale integration; Performance evaluation; Plastic packaging; Resins; Temperature; Testing; Thermal stresses; Thermoelasticity;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9894
Type :
jour
DOI :
10.1109/96.533901
Filename :
533901
Link To Document :
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