Title :
Electromagnetic Compatibility-Oriented Study on Through Silicon Single-Walled Carbon Nanotube Bundle Via (TS-SWCNTBV) Arrays
Author :
Zhao, Wen-Sheng ; Yin, Wen-Yan ; Guo, Yong-Xin
Author_Institution :
State Key Lab. of MOI, Zhejiang Univ., Hangzhou, China
Abstract :
Electromagnetic compatibility-oriented study is performed for accurately characterizing through silicon single-walled carbon nanotube bundle via (TS-SWCNTBV) array in this paper. Based on the modified equivalent lumped-element circuit model of a pair of TS-SWCNTBVs, its forward transmission coefficient, in comparison with copper- and tungsten-based TSVs, is investigated for different metallic fractions of the SWCNTs, with quantum effects treated appropriately. The 3-D transmission-line method (TLM) is further employed for studying mutual couplings in three, four, and nine TS-SWCNTBV arrays, respectively, where the effects of their geometrical and physical parameters on the effective capacitance and conductance are examined in detail. Also, transient coupling noises in different arrays excited by a clock signal, respectively, are predicted and compared, which are useful for the design of high density TS-SWCNTBV arrays with better signal transmission performance.
Keywords :
capacitance; carbon nanotubes; electric admittance; electromagnetic compatibility; electromagnetic coupling; equivalent circuits; integrated circuit metallisation; lumped parameter networks; three-dimensional integrated circuits; transmission line theory; 3D TLM; 3D transmission-line method; SWCNT metallic fractions; capacitance; clock signal high density TS-SWCNTBV arrays; conductance; electromagnetic compatibility-oriented study; equivalent lumped element circuit model; forward transmission coefficient; mutual couplings; quantum effects; through silicon single-walled carbon nanotube bundle via arrays; transient coupling noises; Conductivity; Copper; Couplings; Integrated circuit modeling; Quantum capacitance; Silicon; Complex effective conductivity; equivalent lumped-element circuit model; mutual coupling; quantum effects; through silicon single-walled carbon nanotube bundle via (TS-SWCNTBV) array; transient coupling noise; transmission-line method (TLM);
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2011.2167336