Study on the characteristics of partial discharges in voids under square voltage by detecting light emission intensity

Author

Wu, Kai ; Pan, Cheng ; Meng, Yongpeng ; Sun, Changhao ; Gao, Minggang ; Qin, Kai ; Long, Hongyu

Author_Institution

State Key Lab. of Electr., Xi´´an Jiaotong Univ., Xi´´an, China

Volume

18

Issue

5

fYear

2011

fDate

10/1/2011 12:00:00 AM

Firstpage

1651

Lastpage

1657

Abstract

In order to quantitatively study partial discharge (PD) behavior in voids under square voltage, the feasibility of PD measurement by detection of light emission intensity was investigated at first. Experiments were carried out to study the influences of void size on the correlation between light emission intensity and PD magnitude and its transition with PD degradation. It is confirmed that a good correlation existed between light emission intensity and PD magnitude in a void with diameter larger than 3mm and the correlation did not change in the PD degradation process. Then, the effect of square voltage rise rate on PD characteristics under square voltage was investigated by detecting light emission intensity. In the PD degradation process, an abnormal phenomenon that the maximum PD magnitude decreased with the increase of voltage rise rate was observed. This was interpreted in terms of the change of surface condition due to PD degradation.

Keywords

partial discharge measurement; voids (solid); PD degradation process; PD magnitude; PD measurement; light emission intensity detection; partial discharge measurement; square voltage rise rate; surface condition; void size; Aging; Correlation; Degradation; Discharges; Partial discharge measurement; Partial discharges; Voltage measurement; PD; degradation; light intensity; square voltage; voltage rise rate;

fLanguage

English

Journal_Title

Dielectrics and Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

1070-9878

Type

jour

DOI

10.1109/TDEI.2011.6032836

Filename

6032836