DocumentCode :
1338590
Title :
Evaluating fault trees (AND and OR gates only) with repeated events
Author :
Brown, Kevin S.
Volume :
39
Issue :
2
fYear :
1990
fDate :
6/1/1990 12:00:00 AM
Firstpage :
226
Lastpage :
235
Abstract :
It is pointed out that a common practice in the evaluation of large fault trees is to truncate the computation by neglecting high-order or low-probability cutsets. A major disadvantage of most simple truncation methods, however, is that their accuracy is indeterminate because they do not establish rigorous bounds on the combined probability of the neglected cutsets. A truncated with residuals algorithm is presented. It uses probability-based truncation and determines a rigorous upper bound on each event-probability by propagating the effect of all the truncated cutsets in the form of numeric residuals. The method applies only to fault trees constructed entirely of AND and OR gates and allows unrestricted use of repeated events
Keywords :
failure analysis; logic gates; probability; reliability theory; AND gates; OR gates; cutsets; fault tree evaluation; numeric residuals; probability-based truncation; reliability; repeated events; rigorous upper bound; truncated with residuals algorithm; Books; Fault trees; Sorting; Upper bound;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.55886
Filename :
55886
Link To Document :
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