DocumentCode :
1338690
Title :
Measurement of the Force on Microparticles in an Energetic Ion Beam
Author :
Trottenberg, Thomas ; Schneider, Viktor ; Kersten, Holger
Author_Institution :
Inst. of Exp. & Appl. Phys., Christian-Albrechts-Univ., Kiel, Germany
Volume :
38
Issue :
4
fYear :
2010
fDate :
4/1/2010 12:00:00 AM
Firstpage :
774
Lastpage :
780
Abstract :
Forces on microparticles in energetic ion beams are investigated experimentally. For this purpose, hollow glass microspheres are injected into a vertically upward directed beam. The particles are illuminated by a diode laser, and their scattered light is recorded with a charge-coupled device camera. From the trajectories, the acceleration and net force on the particles are determined. It is found that the force is significantly higher than the expected ion drag force. This additional part of the total force is explained with fast neutral atoms produced by charge-exchange collisions. Special attention is paid to the momentum contribution from sputtered atoms, which is shown to be negligible in this experiment.
Keywords :
dusty plasmas; ion beams; plasma diagnostics; plasma transport processes; plasma-beam interactions; charge-coupled device camera; charge-exchange collisions; diode laser; energetic ion beam; fast neutral atoms; force measurement; hollow glass microspheres; ion drag force; microparticles; particle acceleration; particle trajectories; scattered light; Complex plasmas; dusty plasmas; ion beams; ion drag; microparticles; particle beam interactions in plasmas; particle charging; particle collisions; particle tracking;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2009.2034857
Filename :
5339186
Link To Document :
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