DocumentCode :
1339196
Title :
ICMTS 1999 [Guest Editorial]
Author :
Jeppson, K.O. ; Mathewson, A.
Author_Institution :
Chalmers University of Technology
Volume :
13
Issue :
2
fYear :
2000
fDate :
5/1/2000 12:00:00 AM
Firstpage :
117
Lastpage :
118
Keywords :
Circuit testing; Integrated circuit manufacture; Microelectronics; Parameter extraction; Semiconductor device manufacture; Semiconductor device modeling; Semiconductor device testing; Solid state circuits; Thermal conductivity; Very large scale integration;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2000.843625
Filename :
843625
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1339196
بازگشت