• DocumentCode
    1339717
  • Title

    Wave profile modification in the free electron laser with and without a waveguide

  • Author

    Fruchtman, Amnon

  • Author_Institution
    Dept. of Phys., Weizmann Inst. of Sci., Rehovot, Israel
  • Volume
    18
  • Issue
    3
  • fYear
    1990
  • fDate
    6/1/1990 12:00:00 AM
  • Firstpage
    424
  • Lastpage
    436
  • Abstract
    The modification of the transverse wave profile by the free electron laser (FEL) interaction in the collective Raman regime is considered. The gain is calculated and the transverse wave profile is found by solving for the eigenvalues and the actual eigenmodes of the system. When a waveguide is employed, a strong FEL interaction is shown to couple various vacuum waveguide modes, as was demonstrated by A. Bhattacharjee et al. (1988). When no waveguide or cavity is present, a coupling parameter which measures the strength of the interaction is identified. Expressions are derived for the gain for large and small values of the coupling parameter, corresponding to a strong optical guiding and large diffraction, respectively. Comparing the present results for the Raman regime with previous results for the strong pump regime, it is shown that the gain scales differently in each case, depending on both the regime of operation and on the beam geometry. The linear analysis is valid when the signal is small, and is useful mainly when the gain is high prior to saturation
  • Keywords
    Raman lasers; eigenvalues and eigenfunctions; free electron lasers; beam geometry; collective Raman regime; coupling parameter; eigenmodes; eigenvalues; free electron laser; gain; interaction; linear analysis; transverse wave profile; vacuum waveguide modes; Eigenvalues and eigenfunctions; Free electron lasers; Laser modes; Optical coupling; Optical diffraction; Optical pumping; Optical saturation; Optical waveguides; Stimulated emission; Waveguide lasers;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.55911
  • Filename
    55911