• DocumentCode
    1339907
  • Title

    Parameter Selection in Sparsity-Driven SAR Imaging

  • Author

    Batu, Özge ; Çetin, Müjdat

  • Author_Institution
    Fac. of Eng. & Natural Sci, Sabanc Univ., Istanbul, Turkey
  • Volume
    47
  • Issue
    4
  • fYear
    2011
  • fDate
    10/1/2011 12:00:00 AM
  • Firstpage
    3040
  • Lastpage
    3050
  • Abstract
    We consider a recently developed sparsity-driven synthetic aperture radar (SAR) imaging approach which can produce superresolution, feature-enhanced images. However, this regularization-based approach requires the selection of a hyper-parameter in order to generate such high-quality images. In this paper we present a number of techniques for automatically selecting the hyper-parameter involved in this problem. We propose and develop numerical procedures for the use of Stein´s unbiased risk estimation, generalized cross-validation, and L-curve techniques for automatic parameter choice. We demonstrate and compare the effectiveness of these procedures through experiments based on both simple synthetic scenes, as well as electromagnetically simulated realistic data. Our results suggest that sparsity-driven SAR imaging coupled with the proposed automatic parameter choice procedures offers significant improvements over conventional SAR imaging.
  • Keywords
    numerical analysis; radar imaging; risk analysis; synthetic aperture radar; L-curve techniques; Stein´s unbiased risk estimation; automatic parameter; electromagnetically simulated realistic data; feature-enhanced images; generalized cross-validation; high-quality images; numerical procedures; parameter selection; regularization-based approach; sparsity-driven SAR imaging; sparsity-driven synthetic aperture radar imaging; superresolution; Closed-form solutions; Image reconstruction; Image resolution; Optimization; Radar polarimetry; Reflectivity; Synthetic aperture radar;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/TAES.2011.6034687
  • Filename
    6034687