• DocumentCode
    1340122
  • Title

    Parametric and nonparametric identification of linear systems in the presence of nonlinear distortions-a frequency domain approach

  • Author

    Schoukens, Johan ; Dobrowiecki, Tadeusz ; Pintelon, Rik

  • Author_Institution
    Dept. ELEC., Vrije Univ., Brussels, Belgium
  • Volume
    43
  • Issue
    2
  • fYear
    1998
  • fDate
    2/1/1998 12:00:00 AM
  • Firstpage
    176
  • Lastpage
    190
  • Abstract
    This paper studies the asymptotic behavior of nonparametric and parametric frequency domain identification methods to model linear dynamic systems in the presence of nonlinear distortions under some general conditions for random multisine excitations. In the first part, a related linear dynamic system (RLDS) approximation to the nonlinear system (NLS) is defined, and it is shown that the differences between the NLS and the RLDS can be modeled as stochastic variables with known properties. In the second part a parametric model for the RLDS is identified. Convergence in probability of this model to the RLDS is proven. A function of dependency is defined to detect and separate the presence of unmodeled dynamics and nonlinear distortions and to bound the bias error on the transfer function estimate
  • Keywords
    convergence; frequency-domain analysis; identification; probability; transfer functions; RLDS approximation; asymptotic behavior; bias error bound; frequency domain identification methods; linear dynamic systems; linear systems; nonlinear distortions; nonparametric identification; parametric identification; probabilistic convergence; random multisine excitations; related linear dynamic system approximation; transfer function estimate; unmodeled dynamics; Distortion measurement; Frequency domain analysis; Frequency estimation; Frequency response; Linear systems; Nonlinear distortion; Nonlinear dynamical systems; Nonlinear systems; Stochastic systems; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Automatic Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9286
  • Type

    jour

  • DOI
    10.1109/9.661066
  • Filename
    661066