Title :
A Novel Simulation Fault Injection Method for Dependability Analysis
Author :
Lee, Dongwoo ; Na, Jongwhoa
Author_Institution :
Korea Aerosp. Univ., South Korea
Abstract :
Presilicon testing and verification is a crucial step in qualifying the RTL for the subsequent implementation phases. This article presents a novel simulation-based fault injection methodology that is applied at the system description level, as opposed to the lower, flattened RT level, in order to reduce simulation time.
Keywords :
circuit simulation; elemental semiconductors; fault diagnosis; semiconductor device reliability; semiconductor device testing; silicon; Si; dependability analysis; presilicon testing; presilicon verification; simulation fault injection method; simulation-based fault injection methodology; Analytical models; Circuit faults; Computational modeling; Costs; Embedded system; Failure analysis; Fault tolerance; Hardware design languages; Redundancy; Reliability engineering; design and test; electronic systems level; fault injection; kernel-based fault injection; reliability;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2009.135
