DocumentCode
1340221
Title
Test Technology TC Newsletter
Volume
26
Issue
6
fYear
2009
Firstpage
96
Lastpage
96
Abstract
This month´s Test Technology TC Newsletter reviews DFT 2009, the IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. It also features upcoming events: 13th Design, Automation, and Test in Europe conference, the IEEE VLSI Test Symposium, and a Call for Papers for ITC 2010.
Keywords
DATE 2010; DFT 2009; ITC 2010; VTS 2010;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2009.156
Filename
5340392
Link To Document