DocumentCode :
1340298
Title :
Measuring jitter and phase error in microprocessor phase-locked loops
Author :
Jenkins, Keith A. ; Eckhardt, James P.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume :
17
Issue :
2
fYear :
2000
Firstpage :
86
Lastpage :
93
Abstract :
The use of phase-locked loops (PLLs) for clock generation in modern microprocessors has been proliferating in recent years. This is because PLLs have the advantages of allowing multiplication of the reference clock frequency and allowing phase alignment between chips. The PLL locks to a reference clock but can generate output clocks that are a multiple of the reference. It is argued that excessive “jitter”, caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured-not just the jitter
Keywords :
digital phase locked loops; jitter; microprocessor chips; accumulated phase error; clock generation; jitter; microprocessor phase-locked loops; multichip system; phase error; Circuit noise; Clocks; Jitter; Microprocessors; Oscilloscopes; Phase locked loops; Phase measurement; Phase noise; Semiconductor device measurement; Working environment noise;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/54.844337
Filename :
844337
Link To Document :
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