• DocumentCode
    1341094
  • Title

    Dynamics of a Charged Particle in Progressive Plane Waves: Stochastic Acceleration. Application to the Wake Field Acceleration Process

  • Author

    Bourdier, Alain ; Drouin, Mathieu ; Davoine, Xavier

  • Author_Institution
    DAM, Commissariat a l´´Energie Atomique (CEA), Arpajon, France
  • Volume
    38
  • Issue
    4
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    728
  • Lastpage
    732
  • Abstract
    The dynamics of a charged particle in a relativistic strong electromagnetic plane wave propagating in vacuum is studied first, the problem is shown to be integrable when the wave propagates in vacuum. One particle in a high-intensity wave, propagating in a vacuum, perturbed by a low-intensity traveling wave is considered next. Resonances are identified, and conditions for resonance overlap are studied. Stochastic acceleration is shown by considering a single particle. It is confirmed in plasma in realistic situations with particle-in-cell code simulations. Finally, it is shown that when considering a low-density plasma interacting with a high-intensity wave perturbed by a low-intensity counterpropagating wave, stochastic heating can provide electrons with the right momentum for trapping in the wakefield and efficient acceleration.
  • Keywords
    perturbation theory; plasma electromagnetic wave propagation; plasma heating; plasma simulation; relativistic plasmas; stochastic processes; wakefield accelerators; charged particle dynamics; low-density plasma interaction; low-intensity traveling wave; particle-in-cell code simulations; perturbation theory; progressive plane waves; relativistic strong electromagnetic plane wave; stochastic acceleration; stochastic heating; vacuum wave propagation; wake field acceleration process; wakefield acceleration; wakefield trapping; Chaos; integrability; laser–matter interaction; stochastic acceleration;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2009.2034165
  • Filename
    5340605