DocumentCode :
1341218
Title :
New Delay-Time Measurements on a 64-kb Josephson–CMOS Hybrid Memory With a 600-ps Access Time
Author :
Fujiwara, Kan ; Liu, Qingguo ; Van Duzer, Theodore ; Meng, Xiaofan ; Yoshikawa, Nobuyuki
Author_Institution :
SanDisk Ltd., Yokkaichi, Japan
Volume :
20
Issue :
1
fYear :
2010
Firstpage :
14
Lastpage :
20
Abstract :
A 64-kb subnanosecond Josephson-CMOS hybrid random-access memory (RAM) has been developed with ultrafast hybrid interface circuits. The hybrid memory is designed and fabricated using a commercial 0.18-??m CMOS process and NEC-SRL´s 2.5- kA/cm2 Nb process for Josephson circuits. The millivolt-level Josephson signals are amplified to volt-level CMOS digital signals by a hybrid interface amplifier, which is the most challenging part of the memory system. The performance of this amplifier is optimized by minimizing its parasitic capacitance loading. The 4-K operation of short-channel CMOS devices and circuits is reviewed, and a complete 4-K CMOS BSIM3 model, which has been verified by experiments, is discussed. The memory bit-line output currents are detected by ultralow-power high-speed Josephson devices. Here, we report the first high-frequency access-time measurements on the full critical path showing 600 ps for a single bit. We discuss future designs made to reduce the crosstalk and improve margins, as well as plans to reduce power dissipation and latency.
Keywords :
CMOS memory circuits; amplifiers; capacitance; high-speed techniques; low-power electronics; random-access storage; superconducting memory circuits; time measurement; 4-K CMOS BSIM3 model; Nb; crosstalk; delay-time measurements; hybrid interface amplifier; memory bit-line output currents; memory size 64 KByte; millivolt-level Josephson signals; parasitic capacitance loading; power dissipation; short-channel CMOS circuits; short-channel CMOS devices; size 0.18 mum; subnanosecond Josephson-CMOS hybrid random-access memory; time 600 ps; ultralow-power high-speed Josephson devices; Access time; high-speed measurement; hybrid memory; interface circuit;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2009.2034471
Filename :
5340624
Link To Document :
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