Title :
Experimental and numerical study of the emitter turn-off thyristor (ETO)
Author :
Li, Yuxin ; Huang, Alex Q. ; Motto, Kevin
Author_Institution :
Centre for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fDate :
5/1/2000 12:00:00 AM
Abstract :
The emitter turn-off thyristor (ETO) is a new family of high power semiconductor devices that is suitable for megawatt power electronics application. ETOs with voltage and current ratings of 4-6 kV and 1-4 kA, have been developed and demonstrated. And those power levels are the highest in silicon power devices and are comparable to those of the gate turn-off thyristor (GTO). Compared to the conventional GTO, the ETO has much shorter storage time, voltage controlled turn-off capability, and much larger reverse biased safe operation area (RBSOA). Furthermore, ETOs have a forward-biased safe operation area (FBSOA) that enables it to control the turn-on di/dt similar to an insulated gate bipolar transistor (IGBT). These combined advantages make the ETO based power system simpler in terms of dv/dt snubber, di/dt snubber, overcurrent protection, resulting in significant savings in the system cost. This paper presents experimental and numerical results that demonstrate the advantages of the ETO
Keywords :
semiconductor device measurement; semiconductor device models; semiconductor device testing; thyristors; ETO; di/dt snubber; dv/dt snubber; emitter turn-off thyristor; forward-biased safe operation area; megawatt power electronics application; overcurrent protection; power semiconductor devices; reverse biased safe operation area; storage time; turn-on di/dt control; voltage controlled turn-off capability; Costs; Current distribution; Insulated gate bipolar transistors; Power electronics; Power semiconductor devices; Power system protection; Power system transients; Snubbers; Thyristors; Voltage;
Journal_Title :
Power Electronics, IEEE Transactions on