Single-Event Transient Testing of Low Dropout PNP Series Linear Voltage Regulators

Author

Allen, Gregory R. ; Adell, Philippe C. ; Chen, Dakai ; Musil, Paul

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

Volume

59

Issue

6

fYear

2012

Firstpage

2764

Lastpage

2771

Abstract

Recommendations are provided for Single Event Transient (SET) testing of low dropout (LDO) PNP series linear voltage regulators. A combination of SPICE circuit simulations and pulsed laser irradiations are used to demonstrate that the equivalent series resistance (ESR), loading conditions and regulator stability are the key elements that govern LDO regulator´s SET response. Pulsed laser testing of several light-like candidates shows similar SET trends and dependences. Due to the additional circuits introduced in an LDO design, we reveal the existence of a thermal shutdown mode that can be triggered by a single event that is also load dependent.

Keywords

SPICE; analogue integrated circuits; voltage regulators; LDO design; LDO regulator; PNP series linear voltage regulators; SPICE circuit simulations; analog integrated circuit; equivalent series resistance; pulsed laser irradiations; pulsed laser testing; regulator stability; single-event transient testing; thermal shutdown mode; Analog integrated circuits; Layout; Power systems; Single event transient; Voltage control; Equivalent series resistance; PNP series linear regulator; power systems; single event transient;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2012.2222442

Filename

6365388