• DocumentCode
    1341390
  • Title

    Statistical estimation of average power dissipation using nonparametric techniques

  • Author

    Yuan, Li-Pen ; Teng, Chin-Chi ; Kang, Sung-Mo

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    6
  • Issue
    1
  • fYear
    1998
  • fDate
    3/1/1998 12:00:00 AM
  • Firstpage
    65
  • Lastpage
    73
  • Abstract
    In this paper, we present a new statistical technique for estimation of average power dissipation in digital circuits. The present parametric statistical technique estimates the average power based on the assumption that the power distribution can be characterized by a preassumed function. Large error can incur when the assumption is not met. On the other hand, the existing nonparametric technique, although accurate, is too conservative and requires a large sample size in order to achieve convergence. For a good tradeoff between simulation accuracy and computational efficiency, we propose a new nonparametric technique using the properties of the order statistics. It is generally applicable to any type of circuit irrespective of its power distribution function. Compared to the existing nonparametric technique, it is much more computationally efficient since it requires a much smaller sample size to achieve the same accuracy specification. This new technique is implemented in the distribution-independent power estimation tool (DIPE). DIPE is empirically demonstrated to be more robust and accurate than the parametric technique.
  • Keywords
    digital integrated circuits; network analysis; nonparametric statistics; DIPE; average power dissipation; computational efficiency; digital circuit; distribution-independent power estimation tool; nonparametric technique; power distribution function; simulation; statistical estimation; Circuit simulation; Computational efficiency; Computational modeling; Design automation; Design engineering; Engines; Power dissipation; Power distribution; Reliability engineering; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.661249
  • Filename
    661249