• DocumentCode
    1341479
  • Title

    Noniterative Digital AC Bridge Balance

  • Author

    Das, Nilangshu K. ; Jayakumar, T. ; Raj, Baldev

  • Author_Institution
    Indira Gandhi Centre for Atomic Res., Kalpakkam, India
  • Volume
    59
  • Issue
    11
  • fYear
    2010
  • Firstpage
    3058
  • Lastpage
    3060
  • Abstract
    This paper proposes an automatic digital ac bridge-balance technique, which is fast and suitable for high-frequency phase and impedance measurement. Digital ac bridges are balanced by least-mean-square algorithms in the feedback path. This traditional heuristic method is less efficient to converge to the balance point of the digital ac bridge unless certain parameters are appropriately selected. In this paper, a simple method has been proposed, in which balance parameters can be analytically computed by a microcontroller and a corrective action is fed to the digital bridge to achieve null. The technique has four stages of measurement to compute to reach bridge balance without any iteration. This method has a promising potential in the development of accurate miniaturized seamlessly frequency-adjustable eddy-current nondestructive test instruments. Simulation examples, along with the experimental results, are shown in this paper to emphasize the accuracy and reliability of this technique.
  • Keywords
    bridge circuits; eddy current testing; electric impedance measurement; least mean squares methods; phase measurement; feedback path; frequency-adjustable eddy-current nondestructive test instruments; high-frequency phase measurement; impedance measurement; least-mean-square algorithms; noniterative digital ac bridge balance; Bridge circuits; Hardware; Impedance; Impedance measurement; Measurement uncertainty; Phase measurement; Voltage measurement; AC bridge; balance parameters; eddy-current test; impedance measurement; nondestructive test; phase measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2010.2066750
  • Filename
    5593880