Title :
Approximate Confidence Intervals for Reliability of a Series System
Author_Institution :
Applied Mathematics and Mechanics Div.//Research Directorate, Benet Weapons Lab.//Watervliet Arsenal//Watervliet, New York 12189 USA
Abstract :
Two solutions are proposed for estimating s-confidence intervals for reliability of a repairable series system comprised of non-constant failure rate components: 1) the system is treated as a sum of renewal processes with the mean and variance of total number of system failures being computed from the moments of failure times of the components; and 2) a pseudo-Bayesian solution is derived for the mean and variance of the log-reliability of a system of Weibull components. In both solution approaches, the central limit theorem is invoked for a sum of component random variables determined from test data such as number of failures or log-reliabilities. s-Confidence limits are then approximated using Gaussian probability tables. The intervals derived yield close-to-exact frequency limits, depending on such variables as number of test failures, number of components, and component parameters.
Keywords :
Bayesian methods; Distributed computing; Frequency estimation; Gaussian distribution; Probability; Random variables; Reliability theory; Statistical distributions; System testing; Weibull distribution; Bayes solution; Renewal process; Series systems; Weibull distribution; s-Confidence interval;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1976.5219991