DocumentCode :
134165
Title :
0.35 µm AMS silicon MOSFET for continous-wave (CW) sub-THz detection in room temperature
Author :
Othman, M.A. ; Harrison, I.
Author_Institution :
Centre for Telecommun. Res. & Innovation (CeTRI), Univ. Teknikal Malaysia Melaka (UTeM), Durian Tunggal, Malaysia
fYear :
2014
fDate :
27-29 May 2014
Firstpage :
471
Lastpage :
474
Abstract :
In this paper we report the detection of sub-THz radiation at 220 GHz by using 0.35 μm Metal Oxide Semiconductor Field Effect Transistor (MOSFET). The observation of photoresponse are measured against gate voltage with a drain current effect at room temperature. The measured photoresponse is a superposition of a generally increasing response with a decrease in VGS coupled with a small peak approximately at threshold and there is an evidence that the MOSFET can be a sensitive sub-THz detector in the room temperature.
Keywords :
MOSFET; elemental semiconductors; silicon; terahertz wave detectors; AMS silicon MOSFET; Si; continous-wave sub-THz detection; drain current effect; frequency 220 GHz; gate voltage; metal oxide semiconductor field effect transistor; photoresponse; size 0.35 mum; sub-THz detector; sub-THz radiation; Current measurement; Detectors; Logic gates; MOSFET; Plasma waves; Radio frequency; 0.35 µm process; MOSFET; photoresponse; sub-THz;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Technology Management and Emerging Technologies (ISTMET), 2014 International Symposium on
Conference_Location :
Bandung
Print_ISBN :
978-1-4799-3703-5
Type :
conf
DOI :
10.1109/ISTMET.2014.6936556
Filename :
6936556
Link To Document :
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