Bias Influence on Corrosion of Plastic Encapsulated Device Metal Systems

Because of apparent anomalies noted on data recorded in tests conducted on PEDs (plastic encapsulated device) a re-examination of the influence of voltage biasing in temperature-humidity-bias testing has been conducted. Applied bias can have an important influence on the reliability of plastic encapsulated transistors, depending on how it is applied. The analysis presented in this paper on the role of bias influence on PED failure rate explains some of the discrepancies that have been noted in the past by the author and other investigators.