Title :
Design and Layout Effects on SET Propagation in 90-nm ASIC and FPGA Test Structures
Author :
Rezgui, Sana ; McCollum, John ; Won, Raymond
Author_Institution :
Actel Corp., Mountain View, CA, USA
Abstract :
SET propagations in ASIC-like and FPGA-like digital circuits are investigated, using 90-nm test structures, by fault injection and radiation tests. SET fault injection tests are used to show the dependence of the final SET-pulse on the design and layout of the logic circuit.
Keywords :
CMOS logic circuits; application specific integrated circuits; field programmable gate arrays; integrated circuit testing; ASIC test structure; ASIC-like digital circuit; FPGA test structure; FPGA-like digital circuit; SET propagation; fault injection test; logic circuit design; logic circuit layout; radiation test; Application specific integrated circuits; Field programmable gate arrays; Logic circuits; MOS devices; Fault injection; SET characterization; propagation and mitigation; radiation tests; reprogrammable and non-volatile flash-based FPGAs;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2060496
