Time-resolved frequency chirp measurement using a silicon-wafer etalon

Author

Tammela, Simo ; Ludvigsen, Hanne ; Kajava, Timo ; Kaivola, Matti

Author_Institution

VTT Electron., Electron. Mater. & Components, Finland

Volume

9

Issue

4

fYear

1997

fDate

4/1/1997 12:00:00 AM

Firstpage

475

Lastpage

477

Abstract

A new method for determination of time-resolved frequency chirp in modulated light sources of optical communication systems is presented. A thin silicon wafer acting as a low-finesse etalon was used as an optical frequency discriminator. The method provides a polarization-insensitive way to easily characterize the frequency chirp with high time-resolution.

Keywords

Fabry-Perot interferometers; chirp modulation; discriminators; distributed feedback lasers; elemental semiconductors; high-speed optical techniques; infrared sources; laser variables measurement; optical modulation; optical transmitters; silicon; spectral analysis; 1.55 mum; DFB laser; Si; Si-wafer etalon; high time-resolution; low-finesse etalon; modulated light sources; optical communication systems; optical frequency discriminator; thin silicon wafer; time-resolved frequency chirp measurement; Chirp modulation; Frequency measurement; Mach-Zehnder interferometers; Optical fiber polarization; Optical interferometry; Optical modulation; Optical pulses; Optical refraction; Pulse measurements; Silicon;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.559393

Filename

559393