• DocumentCode
    1341740
  • Title

    Robust estimation of rigid-body 3-D motion parameters based on point correspondences

  • Author

    Papadimitriou, Theophilos ; Diamantaras, Konstantinos I. ; Strintzis, Michael G. ; Roumeliotis, Manos

  • Author_Institution
    Educ. Technol. Lab, Univ. of Macedonia, Thessaloniki, Greece
  • Volume
    10
  • Issue
    4
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    541
  • Lastpage
    549
  • Abstract
    The estimation of rigid-body 3-D motion parameters using point correspondences from a pair of images under perspective projection is, typically, very sensitive to noise. We present a novel robust method combining two approaches: (1) the SVD analysis of a linear operator resulting from the feature points and the displacement vectors and (2) a modified version of the well-known weighted least-squares method proposed by Huber in the context of robust statistics. We give a detailed rank analysis of the involved linear operator and study the effects of noise. We also propose a robust method guided by the structure of this operator, using weighted least squares and data partitioning. The method has been tested on artificial data and on real image sequences showing a remarkable robustness, even in the presence of up to 50% outliers in the data set
  • Keywords
    image sequences; least squares approximations; mathematical operators; motion estimation; noise; SVD analysis; artificial data; data partitioning; data set; displacement vectors; feature points; linear operator; outliers; perspective projection; point correspondences; rank analysis; real image sequences; rigid-body 3D motion parameters; robust estimation; robust statistics; weighted least-squares method; Educational technology; Image sequences; Informatics; Laboratories; Least squares methods; Motion estimation; Noise robustness; Nonlinear equations; Statistical analysis; Vectors;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems for Video Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8215
  • Type

    jour

  • DOI
    10.1109/76.844999
  • Filename
    844999