• DocumentCode
    1341822
  • Title

    Foreword for the Special Issue on ESD Technology

  • Author

    Boselli, G. ; Ker, Ming-Dou ; Duvvury, Charvaka

  • Author_Institution
    Analog ESD Group Manager, Texas Instruments Incorporated, Dallas, TX, USA
  • Volume
    12
  • Issue
    4
  • fYear
    2012
  • Firstpage
    588
  • Lastpage
    588
  • Abstract
    The four invited papers in this special issue focus on ESD technology. The first three are revised papers that were presented at the 2011 EOS/ESD Symposium, while the final ESD paper is an invited review paper to describe ESD protect design issues in state-of-the-art high voltage devices.
  • Keywords
    Electrostatic discharges; Meetings; Special issues and sections;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2012.2225232
  • Filename
    6365857
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1341822