Title :
Comments on "Countable Failures
Author_Institution :
Dept 7246, Zone 79; Lockheed-Georgia Co; Marietta, GA 30063 USA.
Keywords :
Aerospace electronics; Fault detection; Hardware; Laboratories; Testing; Voting; Weapons;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1977.5220111
