• DocumentCode
    1342214
  • Title

    Cost Model for Testing Program Based on Nonhomogeneous Poisson Failure Model

  • Author

    Donelson, John, III

  • Author_Institution
    Institute for Defense Analyses; Program Analysis Division; 400 Army-Navy Drive; Arlington, VA 22202 USA
  • Issue
    3
  • fYear
    1977
  • Firstpage
    189
  • Lastpage
    194
  • Abstract
    A model for the s-expected cost of a development testing program is presented in this paper. The total cost function consists of two terms. The first term is proportional to the duration of the testing program; the second term is a loss function that assesses additional costs for failure to meet reliability goals during the testing program. The reliability growth model assumes that failures during the program occur according to a nonhomogeneous Poisson process having a power-law rate. An example shows how the duration of the test program can be chosen to minimize s-expected total cost.
  • Keywords
    Cost function; Delay; Hardware; Production; Prototypes; Reliability engineering; Reliability theory; Stochastic processes; System testing; Cost minimization; Duane model; Nonhomogeneous Poisson process; Reliability growth;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1977.5220112
  • Filename
    5220112