DocumentCode
1342214
Title
Cost Model for Testing Program Based on Nonhomogeneous Poisson Failure Model
Author
Donelson, John, III
Author_Institution
Institute for Defense Analyses; Program Analysis Division; 400 Army-Navy Drive; Arlington, VA 22202 USA
Issue
3
fYear
1977
Firstpage
189
Lastpage
194
Abstract
A model for the s-expected cost of a development testing program is presented in this paper. The total cost function consists of two terms. The first term is proportional to the duration of the testing program; the second term is a loss function that assesses additional costs for failure to meet reliability goals during the testing program. The reliability growth model assumes that failures during the program occur according to a nonhomogeneous Poisson process having a power-law rate. An example shows how the duration of the test program can be chosen to minimize s-expected total cost.
Keywords
Cost function; Delay; Hardware; Production; Prototypes; Reliability engineering; Reliability theory; Stochastic processes; System testing; Cost minimization; Duane model; Nonhomogeneous Poisson process; Reliability growth;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1977.5220112
Filename
5220112
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