DocumentCode :
1342214
Title :
Cost Model for Testing Program Based on Nonhomogeneous Poisson Failure Model
Author :
Donelson, John, III
Author_Institution :
Institute for Defense Analyses; Program Analysis Division; 400 Army-Navy Drive; Arlington, VA 22202 USA
Issue :
3
fYear :
1977
Firstpage :
189
Lastpage :
194
Abstract :
A model for the s-expected cost of a development testing program is presented in this paper. The total cost function consists of two terms. The first term is proportional to the duration of the testing program; the second term is a loss function that assesses additional costs for failure to meet reliability goals during the testing program. The reliability growth model assumes that failures during the program occur according to a nonhomogeneous Poisson process having a power-law rate. An example shows how the duration of the test program can be chosen to minimize s-expected total cost.
Keywords :
Cost function; Delay; Hardware; Production; Prototypes; Reliability engineering; Reliability theory; Stochastic processes; System testing; Cost minimization; Duane model; Nonhomogeneous Poisson process; Reliability growth;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1977.5220112
Filename :
5220112
Link To Document :
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